Transient noise artifacts -- glitches -- have long troubled instrument commissioners and data analysts alike. In the pursuit and characterization of signals from compact binary mergers they populate the search background, raising the bar for confident detections, and contaminate confidently detected signals, requiring targeted mitigation before binary properties can be inferred. I will discuss some of the most problematic glitches we encounter, the tools we have used to understand and mitigate them, and present a new approach we have developed to construct parameterized models of frequently encountered glitches.
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